MATR 23603 - Scanning Probe Microscopy

CR. 1. Scanning Probe Microscopy is a course that will introduce students to various types of scanning probe microscopy. We will cover techniques such as atomic force microscopy (AFM), near-field optical microscopy (NSOM) and scanning tunneling microscopy (STM). We will discuss how one uses these instruments to characterize materials and study their mechanical properties. The course will start with fundamental concepts such as simple harmonic motion and mechanical stress in materials demystify the complexities of various scanning probe microscopes. There will be various hands on activities that will allow students to investigate many of the fundamental concepts discussed.

Cr. 1.