MATR 23603 - Scanning Probe Microscopy

Scanning Probe Microscopy is a course that will introduce students to various types of scanning probe microscopy. We will cover techniques such as atomic force microscopy (AFM), near-field optical microscopy (NSOM) and scanning tunneling microscopy (STM). We will discuss how one uses these instruments to characterize materials and study their mechanical properties. The course will start with fundamental concepts such as simple harmonic motion and mechanical stress in materials demystify the complexities of various scanning probe microscopes. There will be various hands on activities that will allow students to investigate many of the fundamental concepts discussed.

Preparation for Course
P or C: PHYS 25100 or 22100 or 21900.

Cr. 1.
Student Learning Outcomes
1. Students will fundamentally understand driven harmonic oscillators and stressed cantilevers. In addition, they will be able to explain how one uses these ideas to measure forces.
2. Students will understand how one is able to use the probe/sample interaction to map a surface of a given material.
3. Students will be able to explain the basic principles behind atomic force microscopy and scanning tunneling microscopy.
4. Students will be able to present the advantages and disadvantages to both atomic force and scanning tunneling microscopy.